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Johnny K O SIN   單建安
PhD, University of Toronto
Professor of Department of Electronic and Computer Engineering
Principal Investigator of Semiconductor Product Analysis and Design Enhancement Center
Departmental Research Area
Solid-State Electronics & Photonics
Individual Research Interest
Novel devices and technology for system-on-a-chip using power semiconductor devices, thin-film transistors, silicon-on-insulator and RF devices, and integrated sensors and RF MEMS devices.
Prof Sin was born in Hong Kong. He received his BASc (1981), MASc (1983), and PhD (1988) degrees, all in Electrical Engineering, from the University of Toronto in Canada. He joined Philips Laboratories, New York, USA, upon the completion of his PhD studies, and was a senior member of the research staff there from 1988 - 1991. Prof Sin joined the Department of Electronic and Computer Engineering, the Hong Kong University of Science and Technology, Hong Kong, in August 1991 as an assistant professor and was promoted to full professor in 2001. He is one of the founding members of the Department, and has served as the Director of the Undergraduate Studies program in the Department from 1998 to 2004. In Fall 1998, he was awarded the Teaching Excellence Appreciation Award by the School of Engineering at the University. He has been the director of the Nanoelectronics Fabrication Facility since 2003, and the director of the SPADE (Semiconductor Product Analysis and Design Enhancement) Center since 2001: a semiconductor failure analysis facility at the University to serve the semiconductor industry. Prof Sin is the holder of 12 patents, and has published over 240 papers in technical journals and refereed conferences. Prof Sin is an Editor of IEEE Electron Device Letters. He has been a member of the IEEE Electron Devices Society Administrative Committee (Power Devices Sub-comittee) since 1998. He has served as technical committee member of the International Symposium on Power Semiconductor Devices and IC’s (ISPSD) since 1999. He is a senior member of IEEE.
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